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Spectrometry, Mass, Secondary Ion

"Spectrometry, Mass, Secondary Ion" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus, MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure, which enables searching at various levels of specificity.

A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.


This graph shows the total number of publications written about "Spectrometry, Mass, Secondary Ion" by people in Harvard Catalyst Profiles by year, and whether "Spectrometry, Mass, Secondary Ion" was a major or minor topic of these publication.
Bar chart showing 7 publications over 5 distinct years, with a maximum of 3 publications in 2007
To see the data from this visualization as text, click here.
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Funded by the NIH National Center for Advancing Translational Sciences through its Clinical and Translational Science Awards Program, grant number UL1TR002541.