Microscopy, Scanning Probe
"Microscopy, Scanning Probe" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus,
MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure,
which enables searching at various levels of specificity.
Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
Below are MeSH descriptors whose meaning is more general than "Microscopy, Scanning Probe".
Below are MeSH descriptors whose meaning is more specific than "Microscopy, Scanning Probe".
This graph shows the total number of publications written about "Microscopy, Scanning Probe" by people in Harvard Catalyst Profiles by year, and whether "Microscopy, Scanning Probe" was a major or minor topic of these publication.
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