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Method for the deviation inspection of integrated circuit chip pin based on Harr wavelet transform

Luo G, Fang H, Fang ZL, Mu GG. Method for the deviation inspection of integrated circuit chip pin based on Harr wavelet transform. Optical Engineering. 2000; 39(6):1712-1716 .


Funded by the NIH National Center for Advancing Translational Sciences through its Clinical and Translational Science Awards Program, grant number UL1TR002541.